机械设计制造及其自动化中英文翻译--逐次定数截尾数据下对一个简单的步进应力模型的估计
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1、 PDF外文:http:/ 3350 字 本科毕业设计(英文翻译) 英文原文 : Estimations For A Simple Step-Stress Model With Progressively Type-II Censored Data 院 系 :  
2、; 能源与环境工程学院 专业年级: 机械设计制造及其自动化 2008 级 学生姓名: 学号: &nbs
3、p;2012 年 5 月 12 日 1 International Journal of Reliability, Quality and Safety Engineering Vol.12, No.5(2005) 385395 World Scientic Publishing Company  
4、; ESTIMATIONS FOR A SIMPLE STEP-STRESS MODEL WITH PROGRESSIVELY TYPE-II CENSORED DATA SHUO-JYE WU and HSIU-MEI LEE Department of Statistics, Tamkang University Tamsui, Taipei 251 Taiwan shuostat.tku.edu.tw DAR-HSIN CHEN Graduate Institute of Finance National Chiao Tung
5、 University Hsinchu City 300, Taiwan Received 1 January 2005 Revised 23 May 2005 With todays high technology, some life tests result in no or very few failures by the end of test. In such cases, an approach is to do life test at higher-than-usual stress conditions in order to obtain fai
6、lures quickly. This study discusses the point and interval estimations of parameters on the simple step-stress model in accelerated life testing with progressive type II censoring. An exponential failure time distribution with mean life that is a log-linear function of stress and a cumulative exposu
7、re model are considered. We derive the maximum likelihood estimators of the model parameters. Confidenc eintervals for the model parameters are established by using pivotal quantity and can be applied to any sample size. A numerical example is investigated to illustrate the proposed methods.
8、 Keywords: Accelerated life test; confidence interval; exponential distribution; maximum likelihood method; pivotal quantity; progressive type II censoring. 1. Introduction Accelerated life test (ALT) is often used for reliability analysis. Test units are run at higher-than-usual stress conditi
9、ons in order to obtain failures quickly. A model relating life length to stress is fitted to the accelerated failure times and then extrapolated to estimate the failure time distribution under usual conditions. The stress loading in an ALT can be applied various ways. They include constant stress, s
10、tep stress, and random stress. Nelson (Ref. 10, Chap. 1) discussed their advantages and disadvantages. In step-stress scheme, a test unit is subjected to successively higher levels of stress. A test unit starts at a specified low stress for a specified length of time. If it does not fail, stress on
11、it is raised and held a specified time. The stress is thus increased step by step until the test unit fails. Generally all test units go through the same specified pattern of stress levels and test times. The simplest step-stress ALT uses only two stress levels and we call simple step-stress ALT. Th
12、e statistical inference in this simple step-stress ALT has been investigated by several authors such as Tang et al., 11Khamis and Higgins, 6Xiong, 12 Yeo and Tang, 2 13Gouno, 5McSorley et al., 8 Dharmadhikari and Rahman, 4 and Alhadeed and Yang.1。 In ALT, tests are often stopped before a
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